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Low temperature x-ray diffraction studies of TaS₂ and LixTiS₂ Dutcher, John Robert


A low temperature x-ray powder diffraction attachment for use on the vertical goniometer of a diffractometer is described. We have found that diffraction patterns obtained with the attachment mounted on the goniometer are of comparable quality to those obtained on the goniometer itself. Using this attachment, the lattice parameter discontinuities associated with a charge density wave phase transition in 1T-TaS₂ near T=200K are measured with an accuracy greater than that of any previous results. Electrochemically prepared samples of Li xTiS₂ near x=0.16 are studied at room temperature and below. Clear evidence for the formation of a stage two superlattice at low temperatures was not obtained.

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