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The deformation of copper whiskers Saimoto, Shigeo

Abstract

The deformation of copper whiskers was studied by testing them at room and low temperatures in a specially built tensometer. The whiskers were grown by the standard method of hydrogen reduction of cupric chloride. X-ray studies of straight and kinked whiskers showed that crystallographic directions of the whisker axis other than <100>, <110>, and <111> are possible. In addition the formation of coherent twins is possible in copper whiskers grown by the above method. Tensile tests at various temperatures revealed a step effect, a hesitant flow and yield points in the flow region which were explained by proposing dislocation mechanisms. Tensile tests in dilute sulphuric acid showed that the oxide coating is not solely responsible for the strength of whiskers.

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