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Level crossing rate and average fade duration for the Beaulieu-Xie fading model Olutayo, Adebola; Ma, Hui; Cheng, Julian; Holzman, Jonathan F.

Abstract

Level crossing rate (LCR) and average fade duration (AFD) of a new (Beaulieu-Xie) fading model are analyzed. The characteristic function method is used to derive the LCR for a diversity scheme using maximal ratio combining. The LCR and AFD of the Beaulieu-Xie fading model show improvement beyond the performance levels of the Ricean and Nakagami-m fading models.

Item Metadata

Title
Level crossing rate and average fade duration for the Beaulieu-Xie fading model
Creator
Olutayo, Adebola; Ma, Hui; Cheng, Julian; Holzman, Jonathan F.
Publisher
IEEE Wireless Communications Letters
Description
Level crossing rate (LCR) and average fade duration (AFD) of a new (Beaulieu-Xie) fading model are analyzed. The characteristic function method is used to derive the LCR for a diversity scheme using maximal ratio combining. The LCR and AFD of the Beaulieu-Xie fading model show improvement beyond the performance levels of the Ricean and Nakagami-m fading models.
Genre
Article
Type
Text
Language
eng
Date Available
2018-03-19
Provider
Vancouver : University of British Columbia Library
Rights
Attribution-NonCommercial-NoDerivatives 4.0 International
DOI
10.14288/1.0364288
URI
http://hdl.handle.net/2429/64857
Affiliation
Applied Science, Faculty of; Non UBC; Engineering, School of (Okanagan)
Citation
A. Olutayo, J. Cheng, and J. F. Holzman, "Level crossing rate and average fade duration for the Beaulieu-Xie fading model," IEEE Wireless Communications Letters, vol. 6, pp. 326-329, 2017.
Publisher DOI
10.1109/LWC.2017.2685506
Peer Review Status
Reviewed
Scholarly Level
Faculty
Rights URI
http://creativecommons.org/licenses/by-nc-nd/4.0/
Aggregated Source Repository
DSpace

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Attribution-NonCommercial-NoDerivatives 4.0 International