Resistivity measurements of thin films of bismuth : applications for building bolometric detectors
department or school: Science, Faculty of
department or school: Physics and Astronomy, Department of
data provider: DSpace
degree campus: UBCV
creator: Padwick, Christopher Grant
issued: 2009-03-26T19:50:59Z
issued: 1997
related degree: Master of Science - MSc
degree grantor: University of British Columbia
description: The resistivity of thin bismuth films grown on sapphire substrates has been measured as a function of growth rate, thickness, and temperature. Seven different samples were measured. In all cases the resistivity of the films was completely unlike the resistivity of the bulk material, and each sample exhibited a negative temperature coefficient of resistance (TCR). A model is presented which provides a physical interpretation of the shape of the resistivity - temperature curve of thin bismuth films. This model is a new contribution to this field of research, since there appears to be no satisfactory explanation for the anomalous temperature dependence of the resistivity of thin bismuth films published in the literature. The sheet resistance of the films at 4.2K was found to decrease with increasing thickness. Based on the experimental data, a bismuth film of thickness 200Å should have a sheet resistance of 188.5Ω/ at helium temperatures. The resistance of the thinner films was found to increase as a function of time when exposed to the air, and this seems to be consistent with a layer of insulating Bi₂O₃, forming at the surface of the film. The sheet resistance and resistivity of a 5000Å thick coating of vapor deposited aluminum was measured as a function of temperature in the range 300K — 4.2K. The resistivity was found to be greater than that of the bulk material at all temperatures, and the sheet resistance at 80K was equal to R = 0.051Ω.
aggregated CHO: https://circle.library.ubc.ca/rest/handle/2429/6573
extent: 9144267 bytes
format: application/pdf
note: RESISTIVITY MEASUREMENTS OF THIN FILMS OF BISMUTH: APPLICATIONS FOR BUILDING BOLOMETRIC DETECTORS By Christopher Grant Padwick B. Sc. Hons (Physics) University of Regina, 1994 A T H E S I S S U B M I T T E D I N P A R T I A L F U L F I L L M E N T O F T H E R E Q U I R E M E N T S F O R T H E D E G R E E O F M A S T E R S O F S C I E N C E in T H E F A C U L T Y O F G R A D U A T E S T U D I E S D E P A R T M E N T O F P H Y S I C S A N D A S T R O N O M Y We accept this thesis as conforming to the required standard T H E U N I V E R S I T Y O F B R I T I S H C O L U M B I A Sept 1997 © Christopher Grant Padwick, 1997 In presenting this thesis in partial fulfilment of the requirements for an advanced degree at the University of British Columbia, I agree that the Library shall make it freely available for reference and study. I further agree that permission for extensive copying of this thesis for scholarly purposes may be granted by the head of my department or by his or her representatives. It is understood that copying or publication of this thesis for financial gain shall not be allowed without my written permission. Department of Physics and Astronomy The University of British Columbia 2075 Wesbrook Place Vancouver, Canada V6T 1W5 Date: 15 A b s t r a c t The resistivity of thin bismuth films grown on sapphire substrates has been measured as a function of growth rate, thickness, and temperature. Seven different samples were measured. In al l cases the resistivity of the films was completely unlike the resistivity of the bulk material, and each sample exhibited a negative temperature coefficient of resistance ( T C R ) . A model is presented which provides a physical interpretation of the shape of the resistivity - temperature curve of thin bismuth films. This model is a new contribution to this field of research, since there appears to be no satisfactory explana-tion for the anomalous temperature dependence of the resistivity of thin bismuth films published in t…
has type: Thesis/Dissertation
date issued: 1997-11
is shown at: 10.14288/1.0085088
language: eng
degree discipline: Physics
provider: Vancouver : University of British Columbia Library
publisher: University of British Columbia
rights: For non-commercial purposes only, such as research, private study and education. Additional conditions apply, see Terms of Use https://open.library.ubc.ca/terms_of_use.
scholar level: Graduate
type: Text
identifier URI: http://hdl.handle.net/2429/6573