@prefix vivo: . @prefix edm: . @prefix ns0: . @prefix dcterms: . @prefix dc: . @prefix skos: . vivo:departmentOrSchool "Non UBC"@en ; edm:dataProvider "DSpace"@en ; ns0:identifierCitation "Taylor, Richard. 2009. Snowflakes, Stress and Semiconductors: Do You See a Pattern Here? 11th Annual Meeting Northwest Section of the American Physical Society. May 15, 2009. University of British Columbia, Vancouver, British Columbia, Canada."@en ; dcterms:contributor "University of British Columbia. Department of Physics and Astronomy"@en, "American Physical Society. Northwestern Section. Meeting"@en ; ns0:rightsCopyright "Taylor, Richard"@en ; dcterms:creator "Taylor, Richard"@en ; dcterms:issued "2009-05-28T17:16:38Z"@en, "2009-05-15"@en ; dcterms:description """Fractals are patterns that repeat at many magnifications. These intricate patterns are found throughout nature, ranging from clouds, rivers and lightning through to our brains, blood vessels and lungs. Due to their prevalence in nature and their growing impact on cultures around the world, fractals have assumed a rapidly expanding role across the sciences and arts. In this talk, I will explore some of the intriguing properties of fractals by taking a meandering walk through the research disciplines I have worked in. These will include nano-electronic circuits, Antarctic ice-shelves, brain structure and artworks. I hope to show a common theme - that quantification of their underlying fractal geometry provides an enhanced understanding well beyond the traditional qualitative views of these diverse systems."""@en ; edm:aggregatedCHO "https://circle.library.ubc.ca/rest/handle/2429/8342?expand=metadata"@en ; dcterms:extent "71082361 bytes"@en, "38650368 bytes"@en ; dc:format "application/octet-stream"@en, "application/vnd.ms-powerpoint"@en ; skos:note "Hard-walled Soft-walledAPL 80, 4381 (2002)• For each column: DG(B) = Gmax(B) - Gmin(B)• Total area covered: A = DBSDG(B)• Number of boxes: N = Int {A/(DB)2}+1Boxcounting Method Variation MethodEMPIRICAL measure of discretenessBismuth Clusters • Bi has a highly anisotropic effective mass:m* ~ 0.001 – 0.26 m0• Phase coherence times tf in Bi at T = 300K:tf ~ 10 – 100 fs• Taking typical m*, tf values at T = 300K:Q = 1 50nm ClusterFCF are critically sensitive to a gate voltage.silicon waferSiO2adhesion layerDNA strandsilicon waferSiO2adhesion layerDNA strandgold nanoparticle Hard-walled Soft-walled APL 80, 4381 (2002) • For each column: ∆G(B) = Gmax(B) − Gmin(B) • Total area covered: A = ∆BΣ∆G(B) • Number of boxes: N = Int {A/(∆B)2}+1 Boxcounting Method Variation Method BS E EQ ∆ ∆ = EMPIRICAL measure of discreteness 11.2 1.4 1.6 0 5 10 GaAs/l aAs D Q In P -0.5 0 0.5 1 1.2 1.4 1.6 D Q Bismuth Clusters • Bi has a highly anisotropic effective mass: m* ~ 0.001 – 0.26 m0 • Phase coherence times τ φ in Bi at T = 300K: τ φ ~ 10 – 100 fs • Taking typical m*, τ φ values at T = 300K: Q = 1 50nm Cluster FCF are critically sensitive to a gate voltage. silicon wafer SiO2 adhesion layer DNA strand silicon wafer SiO2 adhesion layer DNA strand gold nanoparticle"@en ; edm:hasType "Presentation"@en ; edm:isShownAt "10.14288/1.0041685"@en ; dcterms:language "eng"@en ; ns0:peerReviewStatus "Unreviewed"@en ; edm:provider "Vancouver : University of British Columbia Library"@en ; dcterms:rights "Attribution-NonCommercial-NoDerivatives 4.0 International"@en ; ns0:rightsURI "http://creativecommons.org/licenses/by-nc-nd/4.0/"@en ; ns0:scholarLevel "Other"@en ; dcterms:title "Snowflakes, Stress and Semiconductors: Do You See a Pattern Here?"@en ; dcterms:type "Text"@en, "Still Image"@en, "Sound"@en ; ns0:identifierURI "http://hdl.handle.net/2429/8342"@en .