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Electrodeposition of Aluminum onto Copper-Coated Printed Circuit Boards Xu, Min; Yue, Guikuan; Bizzotto, Dan; Asselin, Edouard
Abstract
The electrodeposition of aluminum thin films onto copper-coated printed circuit boards from aluminum chloride-trimethylphenylammonium chloride ionic liquids is studied. Various electrodeposition methods with different surface pretreatment procedures were investigated and compared to optimize the deposited aluminum morphology and properties. For the same amount of charge, a pulse current deposition approach applied at a low duty cycle of 10 % allowed the use of higher deposition current densities, leading to finer and more compact aluminum deposits compared with those produced by constant potential and constant current deposition techniques. Pulse current deposition with various peak current densities of −25 mA/cm2 to −65 mA/cm2 was conducted over a temperature range of 20 °C to 60 °C. At a moderate temperature of 40 °C, the electrodeposited aluminum layer was the most adherent. An increase of peak current density did not have an obvious effect on the deposit morphology, but it led to an increased amount of both deposited aluminum and incorporated impurities (oxygen and chloride). At room temperature, the electrical resistivity of the copper-coated printed circuit boards with deposited aluminum decreased as the peak current density for aluminum deposition increased.
Item Metadata
Title |
Electrodeposition of Aluminum onto Copper-Coated Printed Circuit Boards
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Creator | |
Publisher |
The Electrochemical Society
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Date Issued |
2017-08-31
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Description |
The electrodeposition of aluminum thin films onto copper-coated printed circuit boards from
aluminum chloride-trimethylphenylammonium chloride ionic liquids is studied. Various
electrodeposition methods with different surface pretreatment procedures were investigated and
compared to optimize the deposited aluminum morphology and properties. For the same amount
of charge, a pulse current deposition approach applied at a low duty cycle of 10 % allowed the
use of higher deposition current densities, leading to finer and more compact aluminum deposits
compared with those produced by constant potential and constant current deposition techniques.
Pulse current deposition with various peak current densities of −25 mA/cm2 to −65 mA/cm2 was
conducted over a temperature range of 20 °C to 60 °C. At a moderate temperature of 40 °C, the
electrodeposited aluminum layer was the most adherent. An increase of peak current density did
not have an obvious effect on the deposit morphology, but it led to an increased amount of both
deposited aluminum and incorporated impurities (oxygen and chloride). At room temperature,
the electrical resistivity of the copper-coated printed circuit boards with deposited aluminum
decreased as the peak current density for aluminum deposition increased.
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Subject | |
Genre | |
Type | |
Language |
eng
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Date Available |
2021-05-11
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Provider |
Vancouver : University of British Columbia Library
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Rights |
Attribution-NonCommercial-NoDerivatives 4.0 International
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DOI |
10.14288/1.0397407
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URI | |
Affiliation | |
Citation |
Min Xu et al 2017 J. Electrochem. Soc. 164 D729
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Publisher DOI |
10.1149/2.1481712jes
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Peer Review Status |
Reviewed
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Scholarly Level |
Faculty; Researcher
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Copyright Holder |
The Electrochemical Society
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Rights URI | |
Aggregated Source Repository |
DSpace
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Item Media
Item Citations and Data
Rights
Attribution-NonCommercial-NoDerivatives 4.0 International