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A Raman spectral characterization of thin-film carbon : the impact of source wavelength variation

University of British Columbia

Raman spectroscopy is ubiquitous in the study of thin-film carbon. Often, the Raman spectrum of a thin-film carbon is characterized in terms of the location of two distinct peaks, a D-peak located around 1360 cm-¹ and a G-peak located about 1580 cm-¹. Many of the material properties of thin-film carbon have been related either to the ratio of the D-peak and G-peak amplitudes or to the ratio of the D-peak and G-peak integrated intensities. In this analysis, I aim to assess whether or not a relationship exists between these two distinct ratios. Through an examination of the Raman spectra associated with a number of representative carbon thin-films, it has been established that the amplitude ratio is indeed related to the corresponding integrated intensity ratio. The samples of thin-film carbon that are probed using Raman spectroscopy have been prepared through the use of plasma-enhanced chemical vapor deposition and rf and dc magnetron sputtering. The slope of this relationship is shown to be related to the source wavelength, larger source wavelengths corresponding to a smaller slope. The scatter about the resultant linear fit is also found to increase as the source wavelength is increased. Recommendation for further study are offered.

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2019-04-29

Attribution-NonCommercial-NoDerivatives 4.0 International

http://hdl.handle.net/2429/69982

Electrical Engineering

University of British Columbia

UBCO

http://creativecommons.org/licenses/by-nc-nd/4.0/