APS Northwest Section 11th Annual Meeting

Snowflakes, Stress and Semiconductors: Do You See a Pattern Here? 2009

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                                       Hard-walled Soft-walled APL 80, 4381 (2002)                               • For each column: ∆G(B) = Gmax(B) − Gmin(B) • Total area covered: A = ∆BΣ∆G(B) • Number of boxes: N = Int {A/(∆B)2}+1 Boxcounting Method Variation Method   BS E EQ ∆ ∆ = EMPIRICAL measure of discreteness 11.2 1.4 1.6 0 5 10 GaAs/l aAs D Q In P -0.5 0 0.5 1 1.2 1.4 1.6 D Q            Bismuth Clusters •  Bi has a highly anisotropic effective mass: m* ~ 0.001 – 0.26 m0 •  Phase coherence times τ φ in Bi at T = 300K: τ φ ~ 10 – 100 fs •  Taking typical m*, τ φ values at T = 300K: Q = 1 50nm Cluster FCF are critically sensitive to a gate voltage.   silicon wafer SiO2 adhesion layer DNA strand silicon wafer SiO2 adhesion layer DNA strand gold nanoparticle

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