American Physical Society Northwestern Section Annual Meeting (APS-NW) (11th : 2009)

Snowflakes, Stress and Semiconductors: Do You See a Pattern Here? Taylor, Richard May 15, 2009

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Hard-walled  Soft-walled  APL 80, 4381 (2002)  Boxcounting Method  Variation Method  • For each column: ∆G(B) = Gmax(B) −Gmin(B) • Total area covered: A = ∆BΣ ∆G(B) • Number of boxes: N = Int {A/(∆B)2}+1  ∆ES Q= ∆EB  EMPIRICAL measure of discreteness  1.6 1.4 D 1.2  GaInAs/l PaAs  1.6 1.4 1.2  10 5 Q10 -0.5 0 0.5 1 Q  D  Bismuth Clusters  • Bi has a highly anisotropic effective mass: m* ~ 0.001 – 0.26 m0 • Phase coherence times τ φ in Bi at T = 300K:  τ φ ~ 10 – 100 fs • Taking typical m*, τ φ values at T = 300K: Q=1  50nm Cluster  FCF are critically sensitive to a gate voltage.  DNA strand  adhesion layer SiO2  silicon wafer  gold nanoparticle  DNA strand  adhesion layer SiO2  silicon wafer  

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