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A Raman and scanning electron microscope analysis of magnetron sputtered thin-film carbon

University of British Columbia

Thin-film carbon coatings possess properties, such as extreme hardness, smoothness, and a nice glossy finish, that make them desirable for a variety of industrial and military applications. This thesis examines the Raman spectra associated with thin-films of carbon that are prepared using magnetron sputtering. The goal is to achieve a high amount of strong bonds, i.e., sp³ bonds, as in diamond, using this inexpensive and widely available deposition process. Raman spectroscopy is the chosen analytical method used for the purpose of this work, since it is non-destructive and widely available. Using Raman spectroscopy, an sp³ content of up to 77 % is determined. This suggests that it is possible to deposit thin-films of carbon that approach the properties of tetrahedral amorphous carbon, a material known for its excellent hardness and durability, using this inexpensive approach. A scanning electron microscope image of one of the thin-films of carbon is acquired and examined, conclusions regarding the transition between the underlaying titanium substrate and the thin-film of carbon being drawn. Further directions for possible research are mentioned.

Text

2015-01-13

Attribution-NonCommercial-NoDerivs 2.5 Canada

http://hdl.handle.net/2429/51893

Electrical Engineering

University of British Columbia

UBCO

http://creativecommons.org/licenses/by-nc-nd/2.5/ca/